Beamlines of the Kurchatov specialized source of synchrotron radiation "KISI-Kurchatov"

LANGMUIR

Beamline for x-ray studies of molecular films on liquid surfaces. The main feature of the beamline is the X-ray optical scheme, which provide possibilities of SR beam deviation from horizontal plane for X-ray measurements on the liquid.

Methods:

• X-ray reflectometry (XRR) - electron density profile along the depth of the structure - thickness, density, roughness of the layers;

• X-ray Standing waves (XSW) - ion distribution profile over the depth of the structure;

• Grazing incidence diffraction (GID) - the crystal structure of two-dimensional systems (lattice parameters, molecular structure, molecular tilt angles, correlation lengths);

• Total X-ray Reflection Fluorescence (TXRF) - the chemical composition of the surface layers.